.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Advances in x-Ray Analysis
William M. Mueller
€ 71.14
FREE Delivery in Ireland
Description for Advances in x-Ray Analysis
Paperback. Series: Advances in X-Ray Analysis. Num Pages: 564 pages, 146 black & white illustrations, biography. BIC Classification: PNR; TJF. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 30. Weight in Grams: 1090.
The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of ... Read more
The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
564
Condition
New
Series
Advances in X-Ray Analysis
Number of Pages
564
Place of Publication
New York, NY, United States
ISBN
9781468476088
SKU
V9781468476088
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Advances in x-Ray Analysis