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Advances in X-Ray Analysis
Mueller, William M.; Fay, Marie
€ 70.12
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Description for Advances in X-Ray Analysis
Paperback. Num Pages: 480 pages, 128 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 25. Weight in Grams: 935.
The torrential flow of technical information appearing in the world sources of literature is creating concern and apprehension among scientific people at all levels. It is extremely difficult to keep abreast of information flowing into a specific field. It is nearly impossible to transcend traditional confines of individual disciplines and put to effective use all pertinent information which stems from continuously increased trans disciplinary research. At the same time the researcher is faced with problems of in creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own ... Read more
The torrential flow of technical information appearing in the world sources of literature is creating concern and apprehension among scientific people at all levels. It is extremely difficult to keep abreast of information flowing into a specific field. It is nearly impossible to transcend traditional confines of individual disciplines and put to effective use all pertinent information which stems from continuously increased trans disciplinary research. At the same time the researcher is faced with problems of in creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
480
Condition
New
Number of Pages
480
Place of Publication
New York, NY, United States
ISBN
9781468487855
SKU
V9781468487855
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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