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Advances in X-Ray Analysis
Mueller, William M.; Fay, Marie; Mallet, Gavin
€ 70.10
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Description for Advances in X-Ray Analysis
Paperback. Num Pages: 472 pages, 151 black & white illustrations, 5 colour illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 25. Weight in Grams: 927.
A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to the civilian economy. The problem is compounded by the torrential flow of technical information. Thirty million books are available on technical subjects, the total increasing at the rate of six hundred every day. There are one hundred thousand technical journals. More scientific work has been published in the past ten years than in all preceding recorded history. Scientists ... Read more
A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to the civilian economy. The problem is compounded by the torrential flow of technical information. Thirty million books are available on technical subjects, the total increasing at the rate of six hundred every day. There are one hundred thousand technical journals. More scientific work has been published in the past ten years than in all preceding recorded history. Scientists ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
472
Condition
New
Number of Pages
472
Place of Publication
New York, NY, United States
ISBN
9781468486759
SKU
V9781468486759
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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