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Validating Technological Innovation
Coniam, David; Falvey, Peter
€ 128.33
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Description for Validating Technological Innovation
Hardback. Num Pages: 258 pages, 51 black & white illustrations, biography. BIC Classification: JNKD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 16. Weight in Grams: 561.
This book discusses Hong Kong’s use of onscreen marking (OSM) in public examinations. Given that Hong Kong leads the way in OSM innovation, this book has arisen from a recognised need to provide a comprehensive, coherent account of the findings of various separate but linked validation studies of onscreen public examinations in Hong Kong. The authors discuss their experience of the validation process, demonstrating how high-stakes innovation should be fully validated by a series of research studies in order to satisfy key stakeholders.
This book discusses Hong Kong’s use of onscreen marking (OSM) in public examinations. Given that Hong Kong leads the way in OSM innovation, this book has arisen from a recognised need to provide a comprehensive, coherent account of the findings of various separate but linked validation studies of onscreen public examinations in Hong Kong. The authors discuss their experience of the validation process, demonstrating how high-stakes innovation should be fully validated by a series of research studies in order to satisfy key stakeholders.
Product Details
Format
Hardback
Publication date
2016
Publisher
Springer Verlag, Singapore Singapore
Number of pages
258
Condition
New
Number of Pages
228
Place of Publication
Singapore, Singapore
ISBN
9789811004322
SKU
V9789811004322
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Coniam, David; Falvey, Peter
David CONIAM is Chair Professor of Curriculum and Assessment and Head of Department of the Department of Curriculum and Instruction in the Faculty of Education & Human Development at The Hong Kong Institute of Education, where he is a teacher educator, working with teachers in Hong Kong primary and secondary schools. His main publication and research interests are in language ... Read more
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