The authors are a group of active researchers in the areas of supply chain management, logistics management, environmental management, and operations management. The authors have widely published in scholarly and professional journals. They possess extensive experience in conducting theory-grounded empirical research. They have secured a number of consultancy projects and research grants. Christina W.Y. Wong is an Associate Professor, ... Read morespecializing in supply chain management and environmental management, in the Institute of Textiles and Clothing, The Hong Kong Polytechnic University. She has co-authored over 60 papers in such journals as Nature, Production and Operations Management, Journal of Operations Management, Journal of Management Information Systems, and others. Kee-hung Lai is Associate Professor in the Department of Logistics and Maritime Studies, The Hong Kong Polytechnic University. He has co-authored five books and over 110 papers in such scholarly journals as California Management Review, Journal of Operations Management, Production & Operations Management, and others. He is the winner of the first annual ProSPER.Net-Scopus Young Scientist Award on sustainable development in the business category in 2009. Y.H. Venus Lun is Director of Shipping Research Center, and Assistant Professor in the Department of Logistics and Maritime Studies at The Hong Kong Polytechnic University. She has co-authored six books published by Inderscience, McGraw -Hill, Springer, and VDM. She has also published more than 40 papers in scholarly journals. T. C. Edwin Cheng is Dean of the Faculty of Business, Fung Yiu King – Wing Hang Bank Professor in Business Administration, and Chair Professor of Management at The Hong Kong Polytechnic University. He has published over 600 papers in such journals as California Management Review, Journal of Operations Management, Management Science, MIS Quarterly, Operations Research, Organization Science, and Production and Operations Management, and co-authored 11 books published by Chapman and Hall, McGraw-Hill, and Springer. Show Less