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Claeys, C.; Simoen, Eeddy - Radiation Effects in Advanced Semiconductor Materials and Devices - 9783540433934 - V9783540433934
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Radiation Effects in Advanced Semiconductor Materials and Devices

€ 257.87
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Description for Radiation Effects in Advanced Semiconductor Materials and Devices Hardback. Summarizes the knowledge of radiation defects in semiconductors, outlining the shortcomings of experimental and modelling techniques. This book also provides information on the application of sensors in nuclear power plants. Series: Springer Series in Materials Science. Num Pages: 426 pages, biography. BIC Classification: KNB; PHK; RNP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 161 x 233 x 31. Weight in Grams: 780.
In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book ... Read more

Product Details

Format
Hardback
Publication date
2002
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
426
Condition
New
Series
Springer Series in Materials Science
Number of Pages
404
Place of Publication
Berlin, Germany
ISBN
9783540433934
SKU
V9783540433934
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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