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9%OFFDaniel Abou-Ras - Advanced Characterization Techniques for Thin Film Solar Cells - 9783527339921 - V9783527339921
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Advanced Characterization Techniques for Thin Film Solar Cells

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Description for Advanced Characterization Techniques for Thin Film Solar Cells Hardback. The book focuses on advanced characterization methods for thin-fi lm solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. Editor(s): Abou-Ras, Daniel; Kirchartz, Thomas; Rau, Uwe. Num Pages: 760 pages. BIC Classification: THRH; THX. Category: (P) Professional & Vocational. Dimension: 249 x 175 x 46. Weight in Grams: 1914.
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

Product Details

Publisher
Wiley-VCH Verlag GmbH
Format
Hardback
Publication date
2016
Condition
New
Weight
1913g
Number of Pages
760
Place of Publication
Weinheim, Germany
ISBN
9783527339921
SKU
V9783527339921
Shipping Time
Usually ships in 4 to 8 working days
Ref
99-1

About Daniel Abou-Ras
Daniel Abou-Ras is senior scientist at the Helmholtz Center Berlin for Materials and Energy, Germany. He obtained his PhD at ETH Zurich, Switzerland. In 2005, he was awarded the MRS Graduate Student Gold Award at the MRS Spring Meeting. His research interests are correlative approaches in scanning as well as transmission electron microscopy, mainly applied on semiconductor devices. ... Read more

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