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. Ed(S): Sikula, Josef; Levinshtein, Michael - Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices - 9781402021695 - V9781402021695
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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices

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Description for Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices Paperback. Proceedings of the NATO Advanced Research Workshop, held in Brno, Czech Republic, 14-16 August 2003 Editor(s): Sikula, Josef; Levinshtein, Michael. Series: NATO Science Series II. Num Pages: 368 pages, biography. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 19. Weight in Grams: 592.

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st ... Read more

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Product Details

Format
Paperback
Publication date
2004
Publisher
Springer-Verlag New York Inc. United States
Number of pages
368
Condition
New
Series
NATO Science Series II
Number of Pages
368
Place of Publication
New York, NY, United States
ISBN
9781402021695
SKU
V9781402021695
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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