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Advances in X-Ray Analysis
Barrett, Charles S.; Newkirk, John B.; Mallett, Gavin R.
€ 72.20
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Description for Advances in X-Ray Analysis
Paperback. Num Pages: 648 pages, 213 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 34. Weight in Grams: 1244.
The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and ... Read more
The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
648
Condition
New
Number of Pages
648
Place of Publication
New York, NY, United States
ISBN
9781468475371
SKU
V9781468475371
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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