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Advances in X-ray Analysis
Jerome B. Cohen
€ 71.38
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Description for Advances in X-ray Analysis
Paperback. Num Pages: 596 pages, black & white illustrations, bibliography. BIC Classification: MMPH; PH. Category: (G) General (US: Trade). Dimension: 254 x 178 x 31. Weight in Grams: 1126.
This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver ... Read more
This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
596
Condition
New
Number of Pages
596
Place of Publication
New York, NY, United States
ISBN
9781461297130
SKU
V9781461297130
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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