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. Ed(S): Barrett, C. S.; Amara, M.; Huang, Ting C.; Bernard, Nick; Knorr, Dietrich - Advances in X-Ray Analysis - 9781461366676 - V9781461366676
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Advances in X-Ray Analysis

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Description for Advances in X-Ray Analysis Paperback. Editor(s): Barrett, C. S.; Amara, M.; Huang, Ting C.; Bernard, Nick; Knorr, Dietrich. Num Pages: 743 pages, 224 black & white illustrations, 2 colour illustrations, biography. BIC Classification: PNF; TGMT; THR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 39. Weight in Grams: 1436.
The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop­ ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
743
Condition
New
Number of Pages
743
Place of Publication
New York, NY, United States
ISBN
9781461366676
SKU
V9781461366676
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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