Stock image for illustration purposes only - book cover, edition or condition may vary.
Advances in x-Ray Analysis
Charles . Ed(S): Barrett
€ 128.29
FREE Delivery in Ireland
Description for Advances in x-Ray Analysis
Paperback. Editor(s): Barrett, Charles. Num Pages: 574 pages, 225 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 30. Weight in Grams: 1104.
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity ... Read more
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
574
Condition
New
Number of Pages
574
Place of Publication
New York, NY, United States
ISBN
9781461399681
SKU
V9781461399681
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Advances in x-Ray Analysis