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. Ed(S): Bowen, D. K.; Gilfrich, John V.; Goldsmith, C.C.; Huang, Ting C.; Jenkins, Ron; Noyan, I. Cev; Predecki, Paul K.; Smith, Deane K. - Advances in X-Ray Analysis - 9780306450457 - V9780306450457
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Advances in X-Ray Analysis

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Description for Advances in X-Ray Analysis Hardback. Editor(s): Bowen, D. K.; Gilfrich, John V.; Goldsmith, C.C.; Huang, Ting C.; Jenkins, Ron; Noyan, I. Cev; Predecki, Paul K.; Smith, Deane K. Num Pages: 787 pages, biography. BIC Classification: PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 51. Weight in Grams: 1630.
The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of ... Read more

Product Details

Format
Hardback
Publication date
1995
Publisher
Springer Science+Business Media United States
Number of pages
787
Condition
New
Number of Pages
787
Place of Publication
, United States
ISBN
9780306450457
SKU
V9780306450457
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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