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. Ed(S): Gilfrich, John V.; Noyan, I. Cev; Jenkins, Ron; Huang, Ting C.; Snyder, Robert L.; Smith, Deane K.; Zaitz, Mary Ann; Predecki, Paul K. - Advances in X-ray Analysis - 9780306458033 - V9780306458033
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Advances in X-ray Analysis

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Description for Advances in X-ray Analysis Hardback. Proceedings of the Forty-fourth Annual Conference on Applications of X-Ray Analysis held in Colorado, Springs, Colorado, July 31-August 4, 1995 Editor(s): Gilfrich, John V.; Noyan, I. Cev; Jenkins, Ron; Huang, Ting C.; Snyder, Robert L.; Smith, Deane K.; Zaitz, Mary Ann; Predecki, Paul K. Num Pages: 908 pages, biography. BIC Classification: PNFS; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 49. Weight in Grams: 1950.
The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled "THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, "100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS". It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, ... Read more

Product Details

Format
Hardback
Publication date
1998
Publisher
Springer Science+Business Media United States
Number of pages
908
Condition
New
Number of Pages
908
Place of Publication
, United States
ISBN
9780306458033
SKU
V9780306458033
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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