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Advances in X-Ray Analysis
Burton L. . Ed(S): Henke
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Description for Advances in X-Ray Analysis
Paperback. Editor(s): Henke, Burton L. Num Pages: 682 pages, biography. BIC Classification: PNR. Category: (G) General (US: Trade). Dimension: 254 x 178 x 35. Weight in Grams: 1303.
This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers ... Read more
This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
682
Condition
New
Number of Pages
682
Place of Publication
New York, NY, United States
ISBN
9781461399650
SKU
V9781461399650
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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