.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Advances in X-Ray Analysis
John C. . Ed(S): Russ
€ 68.74
FREE Delivery in Ireland
Description for Advances in X-Ray Analysis
Paperback. Editor(s): Russ, John C. Num Pages: 398 pages, 104 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 244 x 170 x 22. Weight in Grams: 720.
In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction. This is a "fluorescence" year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop ment of practical hardware, and that each presents analytical pos sibilities which can hardly be ignored in ... Read more
In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction. This is a "fluorescence" year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop ment of practical hardware, and that each presents analytical pos sibilities which can hardly be ignored in ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
398
Condition
New
Number of Pages
398
Place of Publication
New York, NY, United States
ISBN
9781461399957
SKU
V9781461399957
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Advances in X-Ray Analysis