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Advances in X-ray Analysis
Camden R. Hubbard
€ 69.55
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Description for Advances in X-ray Analysis
Paperback. Num Pages: 492 pages, biography. BIC Classification: PHM. Category: (G) General (US: Trade). Dimension: 244 x 170 x 25. Weight in Grams: 846.
At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases ... Read more
At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
492
Condition
New
Number of Pages
492
Place of Publication
New York, NY, United States
ISBN
9781461337294
SKU
V9781461337294
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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