.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Advances in X-Ray Analysis: Volume 10
Newkirk, John B.; Mallett, Gavin R.
€ 71.05
FREE Delivery in Ireland
Description for Advances in X-Ray Analysis: Volume 10
paperback. Num Pages: 558 pages, 220 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 29. Weight in Grams: 1075.
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer United States
Number of pages
558
Condition
New
Number of Pages
558
Place of Publication
New York, NY, United States
ISBN
9781468478372
SKU
V9781468478372
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Advances in X-Ray Analysis: Volume 10