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Tan, Cher Ming; Gan, Zhenghao; Hou, Yuejin; Li, Wei - Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - 9780857293091 - V9780857293091
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

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Description for Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Hardback. This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability. Series: Springer Series in Reliability Engineering. Num Pages: 152 pages, 19 black & white tables, biography. BIC Classification: PBKJ; TGPQ; TGPR; TJFD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 15. Weight in Grams: 438.

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.

To help readers cope with the increasing sophistication of FEMs’ applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:

  • introduce the principle of FEMs;
  • review numerical modeling of ULSI interconnect reliability;
  • describe the physical mechanism of ULSI interconnect reliability encountered in the electronics ... Read more
  • discuss in detail the use of FEMs to understand and improve ULSI interconnect reliability from both the physical and practical perspective, incorporating the Monte Carlo method.

A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader’s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included.

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.

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Product Details

Format
Hardback
Publication date
2011
Publisher
Springer London Ltd United Kingdom
Number of pages
152
Condition
New
Series
Springer Series in Reliability Engineering
Number of Pages
152
Place of Publication
England, United Kingdom
ISBN
9780857293091
SKU
V9780857293091
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Tan, Cher Ming; Gan, Zhenghao; Hou, Yuejin; Li, Wei
Dr Tan is a member of the academic staff at the Nanyang Technological University, Singapore, and has been working on interconnect reliability for more than 10 years. He has published more than 150 technical papers in this area. His work includes the numerical modeling of interconnect reliability, reliability physics of interconnects, testing methodologies of interconnect reliability, failure analysis of interconnects, ... Read more

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