.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Assessing Fault Model and Test Quality
Butler, Kenneth M.; Mercer, M. Ray
€ 130.55
FREE Delivery in Ireland
Description for Assessing Fault Model and Test Quality
Hardback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 132 pages, biography. BIC Classification: T; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 11. Weight in Grams: 880.
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks ... Read more
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks ... Read more
Product Details
Format
Hardback
Publication date
1991
Publisher
Kluwer Academic Publishers United States
Number of pages
132
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
132
Place of Publication
Dordrecht, Netherlands
ISBN
9780792392224
SKU
V9780792392224
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Assessing Fault Model and Test Quality