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Advances in X-Ray Analysis
. Ed(S): Barrett, Charles S.; Predecki, Paul K.
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Description for Advances in X-Ray Analysis
Paperback. Editor(s): Barrett, Charles S.; Predecki, Paul K. Num Pages: 408 pages, biography. BIC Classification: PG. Category: (G) General (US: Trade). Dimension: 254 x 178 x 21. Weight in Grams: 780.
The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. ... Read more
The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
408
Condition
New
Number of Pages
408
Place of Publication
New York, NY, United States
ISBN
9781461294993
SKU
V9781461294993
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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