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Anomalous X-ray Scattering for Materials Characterization
Yoshio Waseda
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Description for Anomalous X-ray Scattering for Materials Characterization
Paperback. Series: Springer Tracts in Modern Physics. Num Pages: 228 pages, biography. BIC Classification: MB; PG; PHM; PNT. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 361.
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, ... Read more
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
228
Condition
New
Series
Springer Tracts in Modern Physics
Number of Pages
214
Place of Publication
Berlin, Germany
ISBN
9783662146378
SKU
V9783662146378
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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