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Xie, Hui; Onal, Cagdas; Regnier, Stephane; Sitti, Metin - Atomic Force Microscopy Based Nanorobotics - 9783642203282 - V9783642203282
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Atomic Force Microscopy Based Nanorobotics

€ 196.15
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Description for Atomic Force Microscopy Based Nanorobotics Hardback. This clearly-expressed, well-organized book introduces designs and prototypes of nanorobotic systems in detail, examining innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy. Series: Springer Tracts in Advanced Robotics. Num Pages: 358 pages, biography. BIC Classification: TBN; TJFM1. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 25. Weight in Grams: 767.

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs ... Read more

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Product Details

Format
Hardback
Publication date
2011
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
358
Condition
New
Series
Springer Tracts in Advanced Robotics
Number of Pages
344
Place of Publication
Berlin, Germany
ISBN
9783642203282
SKU
V9783642203282
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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