Stock image for illustration purposes only - book cover, edition or condition may vary.
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Greg Haugstad
€ 168.72
FREE Delivery in Ireland
Description for Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Hardcover. This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). Num Pages: 488 pages, Illustrations. BIC Classification: PDND; TBN; TG. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 29. Weight in Grams: 834.
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”
Product Details
Format
Hardback
Publication date
2012
Publisher
John Wiley & Sons Inc United Kingdom
Number of pages
488
Condition
New
Number of Pages
496
Place of Publication
New York, United States
ISBN
9780470638828
SKU
V9780470638828
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Greg Haugstad
GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as ... Read more
Reviews for Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications