×


 x 

Shopping cart
. Ed(S): Cohen, Samuel H.; Lightbody, Marcia L. - Atomic Force Microscopy/Scanning Tunneling Microscopy 2 - 9781475793277 - V9781475793277
Stock image for illustration purposes only - book cover, edition or condition may vary.

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

€ 184.91
FREE Delivery in Ireland
Description for Atomic Force Microscopy/Scanning Tunneling Microscopy 2 Paperback. Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994 Editor(s): Cohen, Samuel H.; Lightbody, Marcia L. Num Pages: 250 pages, biography. BIC Classification: PHN; PNF; PS; TGMT. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 14. Weight in Grams: 507.
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
250
Condition
New
Number of Pages
250
Place of Publication
New York, NY, United States
ISBN
9781475793277
SKU
V9781475793277
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

Reviews for Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Goodreads reviews for Atomic Force Microscopy/Scanning Tunneling Microscopy 2


Subscribe to our newsletter

News on special offers, signed editions & more!