.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Atomic Force Microscopy/Scanning Tunneling Microscopy
. Ed(S): Bray, M. T.; Cohen, Samuel H.; Lightbody, Marcia L.
€ 196.93
FREE Delivery in Ireland
Description for Atomic Force Microscopy/Scanning Tunneling Microscopy
Paperback. Editor(s): Bray, M. T.; Cohen, Samuel H.; Lightbody, Marcia L. Num Pages: 454 pages, biography. BIC Classification: PHN; PNF; PS; TGMT. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 24. Weight in Grams: 876.
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication ... Read more
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
454
Condition
New
Number of Pages
454
Place of Publication
New York, NY, United States
ISBN
9781475793246
SKU
V9781475793246
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Atomic Force Microscopy/Scanning Tunneling Microscopy
`The editors have done a fine job assembling a variety of contributions of varied style, topics, and current relevance into a coherent whole. The quality of the images, typesetting are all excellent and the book is organized in a thoughtful way.' Scanning