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Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.; Newbury, Dale E. (National Institute Of Standards And Technology, Gaithersburg, Md, Usa); Echlin, Patrick; Joy, David C.; Romig
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Description for Scanning Electron Microscopy and X-Ray Microanalysis
Paperback. Num Pages: 840 pages, biography. BIC Classification: PSC; RB; TGMT. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 42. Weight in Grams: 1576.
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, ... Read more
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
840
Condition
New
Number of Pages
840
Place of Publication
New York, NY, United States
ISBN
9781461276531
SKU
V9781461276531
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Scanning Electron Microscopy and X-Ray Microanalysis
From a review of the first edition: `The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.' Microscope Journal