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Lyman, Charles E. (Lehigh University, Bethlehem, Pa, Usa); Lifshin, Eric; Peters, Klaus-Rudiger; Newbury, Dale E. (National Institute Of Standards An - Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy - 9780306435911 - V9780306435911
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Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy

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Description for Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy Paperback. Num Pages: 407 pages, 133 black & white illustrations. BIC Classification: PSC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 246 x 302 x 25. Weight in Grams: 726.
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out ... Read more

Product Details

Format
Paperback
Publication date
1990
Publisher
Springer Science+Business Media United States
Number of pages
407
Condition
New
Number of Pages
407
Place of Publication
, United States
ISBN
9780306435911
SKU
V9780306435911
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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