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Built-in Test for Very Large Scale Integration
Paul H. Bardell
€ 279.02
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Description for Built-in Test for Very Large Scale Integration
Hardcover. Presents the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. The intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students. Num Pages: 368 pages, Ill. BIC Classification: TGMT; TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 181 x 26. Weight in Grams: 678.
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, ... Read more
This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, ... Read more
Product Details
Format
Hardback
Publication date
1987
Publisher
John Wiley and Sons Ltd United States
Number of pages
368
Condition
New
Number of Pages
368
Place of Publication
, United States
ISBN
9780471624639
SKU
V9780471624639
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Paul H. Bardell
Paul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley.
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