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Mallett, Gavin R.; Newkirk, John B.; Pfeiffer, Heinz G. - Advances in X-Ray Analysis - 9781468486780 - V9781468486780
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Advances in X-Ray Analysis

€ 191.84
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Description for Advances in X-Ray Analysis Paperback. Num Pages: 499 pages, 84 black & white illustrations, 3 colour illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 26. Weight in Grams: 972.
X-ray emission spectrography, while based on Moseley's work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago. The central theme of this conference, quantitative methods in X-ray spectrometric analy­ sis, and the large number of papers on that subject attest to the growth of the application and usefulness of X-ray emission. It is a privilege to have as an invited speaker Laverne Birks, one of the original group that put X-ray emission into analytical chemistry. Determination of elements above titanium in the periodic table was considered the province of ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
499
Condition
New
Number of Pages
499
Place of Publication
New York, NY, United States
ISBN
9781468486780
SKU
V9781468486780
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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