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Advances in X-Ray Analysis
William M. Mueller
€ 64.97
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Description for Advances in X-Ray Analysis
Paperback. Num Pages: 376 pages, 204 black & white illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 20. Weight in Grams: 567.
It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis ... Read more
It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
376
Condition
New
Number of Pages
376
Place of Publication
New York, NY, United States
ISBN
9781468474039
SKU
V9781468474039
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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