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Beam Effects, Surface Topography and Depth Profiling in Surface Analysis
. Ed(S): Czanderna, Alvin W.; Madey, Theodore E.; Powell, Cedric J.
€ 193.70
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Description for Beam Effects, Surface Topography and Depth Profiling in Surface Analysis
Hardback. Suitable for newcomers to the field of surface analysis, this book features photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. It describes the principles, techniques, and methods vital for efficient surface analysis. Editor(s): Czanderna, Alvin W.; Madey, Theodore E.; Powell, Cedric J. Series: Methods of Surface Characterization. Num Pages: 430 pages, biography. BIC Classification: PNRX; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 25. Weight in Grams: 1790.
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly ... Read more
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly ... Read more
Product Details
Format
Hardback
Publication date
1998
Publisher
Springer Science+Business Media United States
Number of pages
430
Condition
New
Series
Methods of Surface Characterization
Number of Pages
430
Place of Publication
, United States
ISBN
9780306458965
SKU
V9780306458965
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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