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. Ed(S): Larsen, P.K.; Dobson, P.J. - Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces - 9781468455823 - V9781468455823
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Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

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Description for Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces Paperback. Proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 Editor(s): Larsen, P.K.; Dobson, P.J. Series: NATO Science Series B. Num Pages: 556 pages, biography. BIC Classification: PHFC; PHM; PNT; TGM. Category: (G) General (US: Trade). Dimension: 254 x 178 x 28. Weight in Grams: 1045.
This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
556
Condition
New
Series
NATO Science Series B
Number of Pages
556
Place of Publication
New York, NY, United States
ISBN
9781468455823
SKU
V9781468455823
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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