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Electron Microdiffraction
Zuo, J.M.; Spence, J. C. H.
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Description for Electron Microdiffraction
Paperback. Num Pages: 382 pages, biography. BIC Classification: PHF; PHFC; PNFS; PS; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 20. Weight in Grams: 593.
Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on ... Read more
Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
382
Condition
New
Number of Pages
358
Place of Publication
New York, United States
ISBN
9781489923554
SKU
V9781489923554
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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