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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
R. F. Egerton
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Description for Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
Hardback. This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy. Num Pages: 207 pages, 109 black & white illustrations, 15 colour illustrations, biography. BIC Classification: PNFS; TBN. Category: (G) General (US: Trade). Dimension: 243 x 165 x 22. Weight in Grams: 458.
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and inner space. Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic ... Read more
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and inner space. Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic ... Read more
Product Details
Publisher
Springer International Publishing AG
Format
Hardback
Publication date
2016
Condition
New
Number of Pages
196
Place of Publication
Cham, Switzerland
ISBN
9783319398761
SKU
V9783319398761
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About R. F. Egerton
Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy. Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, ... Read more
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