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Thin Film and Depth Profile Analysis
H. . Ed(S): Oechsner
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Description for Thin Film and Depth Profile Analysis
paperback. With contributions by numerous experts Editor(s): Oechsner, H. Series: Topics in Current Physics. Num Pages: 208 pages, biography. BIC Classification: PNFC; PNFS; PNR; TGM. Category: (P) Professional & Vocational. Dimension: 244 x 170 x 12. Weight in Grams: 394.
The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation ... Read more
The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer Germany
Number of pages
208
Condition
New
Series
Topics in Current Physics
Number of Pages
208
Place of Publication
Berlin, Germany
ISBN
9783642465017
SKU
V9783642465017
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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