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Data Mining and Diagnosing IC Fails
Leendert M. (Ibm Microelectronics Division) Huisman
€ 128.53
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Description for Data Mining and Diagnosing IC Fails
Hardback. There are many techniques for analyzing IC fails. This book addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. Series: Frontiers in Electronic Testing. Num Pages: 270 pages, 46 black & white illustrations, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 15. Weight in Grams: 573.
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and ... Read more
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and ... Read more
Product Details
Format
Hardback
Publication date
2005
Publisher
Springer-Verlag New York Inc. United States
Number of pages
270
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
250
Place of Publication
New York, NY, United States
ISBN
9780387249933
SKU
V9780387249933
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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