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Design for AT-speed Test, Diagnosis and Measurement
Benoit . Ed(S): Nadeau-Dostie
€ 181.89
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Description for Design for AT-speed Test, Diagnosis and Measurement
Paperback. Editor(s): Nadeau-Dostie, Benoit. Series: Frontiers in Electronic Testing. Num Pages: 256 pages, biography. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 254 x 178 x 14. Weight in Grams: 500.
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, ... Read more
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
256
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
239
Place of Publication
New York, NY, United States
ISBN
9781475782912
SKU
V9781475782912
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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