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Designer's Guide to Built-in Self-Test
Charles E. Stroud
€ 249.90
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Description for Designer's Guide to Built-in Self-Test
Paperback. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: THR; TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 18. Weight in Grams: 528.
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based ... Read more
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
340
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
320
Place of Publication
New York, NY, United States
ISBN
9781475776263
SKU
V9781475776263
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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