Digital Noise Monitoring of Defect Origin
Telman Aliev
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Description for Digital Noise Monitoring of Defect Origin
Paperback. Series: Lecture Notes in Electrical Engineering. Num Pages: 236 pages, biography. BIC Classification: PBW; THR. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 337.
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in ... Read more
Show LessProduct Details
Format
Paperback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
236
Condition
New
Series
Lecture Notes in Electrical Engineering
Number of Pages
224
Place of Publication
New York, NY, United States
ISBN
9781441944108
SKU
V9781441944108
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Digital Noise Monitoring of Defect Origin
From the reviews: “The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in ... Read more