Efficient Test Methodologies for High-Speed Serial Links
Hong, Dongwoo; Cheng, Kwang-Ting
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Description for Efficient Test Methodologies for High-Speed Serial Links
Hardback. Covering new and promising techniques for cost-effectively testing high-speed interfaces with high test coverage, the authors focus on efficient test methodologies for jitter and bit-error-rate, widely used for assessing the quality of communication systems. Series: Lecture Notes in Electrical Engineering. Num Pages: 110 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 7. Weight in Grams: 750.
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
Product Details
Format
Hardback
Publication date
2009
Publisher
Springer Netherlands
Number of pages
110
Condition
New
Series
Lecture Notes in Electrical Engineering
Number of Pages
98
Place of Publication
Dordrecht, Netherlands
ISBN
9789048134427
SKU
V9789048134427
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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