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Electron Beam Testing Technology
John T. L. . Ed(S): Thong
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Description for Electron Beam Testing Technology
Paperback. Editor(s): Thong, John T. L. Series: Microdevices. Num Pages: 478 pages, biography. BIC Classification: PHF; PHFC; PNFS; THR; TJFD. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 24. Weight in Grams: 826.
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester ... Read more
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
478
Condition
New
Series
Microdevices
Number of Pages
462
Place of Publication
New York, United States
ISBN
9781489915245
SKU
V9781489915245
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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