Applied Interval Analysis
Jaulin, Luc; Kieffer, Michel; Didrit, Olivier; Walter, Eric
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Description for Applied Interval Analysis
Paperback. Num Pages: 379 pages, biography. BIC Classification: PBF; PBW; TBC; TJF. Category: (P) Professional & Vocational. Dimension: 235 x 156 x 21. Weight in Grams: 560.
At the core of many engineering problems is the solution of sets of equa tions and inequalities, and the optimization of cost functions. Unfortunately, except in special cases, such as when a set of equations is linear in its un knowns or when a convex cost function has to be minimized under convex constraints, the results obtained by conventional numerical methods are only local and cannot be guaranteed. This means, for example, that the actual global minimum of a cost function may not be reached, or that some global minimizers of this cost function may escape detection. By contrast, interval ... Read more
At the core of many engineering problems is the solution of sets of equa tions and inequalities, and the optimization of cost functions. Unfortunately, except in special cases, such as when a set of equations is linear in its un knowns or when a convex cost function has to be minimized under convex constraints, the results obtained by conventional numerical methods are only local and cannot be guaranteed. This means, for example, that the actual global minimum of a cost function may not be reached, or that some global minimizers of this cost function may escape detection. By contrast, interval ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer London Ltd United Kingdom
Number of pages
395
Condition
New
Number of Pages
379
Place of Publication
England, United Kingdom
ISBN
9781447110675
SKU
V9781447110675
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Applied Interval Analysis
From the reviews: "Applied Interval Analysis is the right book at the right time to move computing with intervals into the mainstream of engineering, financial, and scientific computing." G. William Walster, Interval Technology Engineering Manager, Sun Microsystems and Member of the Editorial Board of Reliable Computing