.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Bou-Sleiman, Sleiman; Ismail, Mohammed
€ 66.95
FREE Delivery in Ireland
Description for Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Paperback. This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). Series: SpringerBriefs in Electrical and Computer Engineering. Num Pages: 89 pages, 70 black & white illustrations, 7 black & white tables, biography. BIC Classification: TJFC; UYS. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 5. Weight in Grams: 177.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
89
Condition
New
Series
SpringerBriefs in Electrical and Computer Engineering
Number of Pages
89
Place of Publication
New York, NY, United States
ISBN
9781441995476
SKU
V9781441995476
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Built-in-Self-Test and Digital Self-Calibration for RF SoCs