Electronics & communications engineering
Results 2761 - 2780 of 11090
Electronics & communications engineering
Hardback. Num Pages: 167 pages, 48 black & white illustrations, biography. BIC Classification: TGPR; TJFD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 11. Weight in Grams: 421.
- Format
- Hardback
- Publication date
- 2014
- Publisher
- Springer International Publishing AG Switzerland
- Number of pages
- 167
- Condition
- New
- SKU
- V9783319091105
- ISBN
- 9783319091105
Hardback
Condition: New
€ 121.99
€ 121.99
Paperback. Num Pages: 167 pages, 48 black & white illustrations, biography. BIC Classification: TGPR; TJF; TJFD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 9. Weight in Grams: 267.
- Format
- Paperback
- Publication date
- 2016
- Publisher
- Springer International Publishing AG Switzerland
- Edition
- Softcover reprint of the original 1st ed. 2015
- Number of pages
- 167
- Condition
- New
- SKU
- V9783319361680
- ISBN
- 9783319361680
Paperback
Condition: New
€ 121.01
€ 121.01
Hardcover. Provides presentations of techniques used for solving quality and reliability problems in telecommunications networks replete with illustrations of their applications to real-world services and world class events. Editor(s): Stavroulakis, Peter. Num Pages: 370 pages, Illustrations. BIC Classification: KJMP; TJK. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 252 x 173 x 25. Weight in Grams: 754.
- Format
- Hardback
- Publication date
- 2002
- Publisher
- John Wiley & Sons Inc United Kingdom
- Edition
- 1st Edition
- Number of pages
- 370
- Condition
- New
- SKU
- V9780470847701
- ISBN
- 9780470847701
Hardback
Condition: New
€ 269.25
€ 269.25
Reliability, Availability and Serviceability of Networks-on-Chip
Cota, Erika; Morais Amory, Alexandre De; Soar...
Paperback. This book examines issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It provides research on the challenges to test, diagnose and tolerate faults in NoC-based systems and includes numerous test strategies. Num Pages: 222 pages, 13 black & white tables, biography. BIC Classification: TJFC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 12. Weight in Grams: 349.
- Format
- Paperback
- Publication date
- 2014
- Publisher
- Springer-Verlag New York Inc. United States
- Number of pages
- 222
- Condition
- New
- SKU
- V9781489973504
- ISBN
- 9781489973504
Paperback
Condition: New
€ 133.13
€ 133.13
Reliability, Availability and Serviceability of Networks-on-chip
Cota, Erika; Morais Amory, Alexandre De; Soar...
Hardback. This book examines issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It provides research on the challenges to test, diagnose and tolerate faults in NoC-based systems and includes numerous test strategies. Num Pages: 209 pages, 13 black & white tables, biography. BIC Classification: TJFC; UKN. Category: (P) Professional & Vocational. Dimension: 241 x 165 x 19. Weight in Grams: 484.
- Format
- Hardback
- Publication date
- 2011
- Publisher
- Springer-Verlag New York Inc. United States
- Edition
- 2012
- Number of pages
- 209
- Condition
- New
- SKU
- V9781461407904
- ISBN
- 9781461407904
Hardback
Condition: New
€ 121.88
€ 121.88
Hardcover. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 624 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational. Dimension: 235 x 162 x 34. Weight in Grams: 982.
- Format
- Hardback
- Publication date
- 2009
- Publisher
- John Wiley and Sons Ltd United Kingdom
- Edition
- 1st Edition
- Number of pages
- 624
- Condition
- New
- SKU
- V9780471731726
- ISBN
- 9780471731726
Hardback
Condition: New
€ 210.65
€ 210.65
Paperback. This book provides critically important information for designing and building reliable cost-effective products. It includes numerous example problems with solutions. Num Pages: 415 pages, 58 black & white tables, 5 colour tables, biography. BIC Classification: PBT; TGPR; TH; TJF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 22. Weight in Grams: 635.
- Publisher
- Springer International Publishing AG
- Format
- Paperback
- Publication date
- 2015
- Edition
- 2nd ed. 2013
- Condition
- New
- SKU
- V9783319033297
- ISBN
- 9783319033297
Paperback
Condition: New
€ 112.25
€ 112.25
Paperback. Presents the findings of COST 246 (1993-1998) - European research initiative in the field of optical telecommunications. This title covers topics such as: lifetime estimation; failure mechanisms; ageing test methods; and, field data and service environments for components. Editor(s): Volotinen, Tarja; Griffioen, Willem; Gadonna, Michel; Limberger, Hans G. Num Pages: 443 pages, biography. BIC Classification: TJK; TTBF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 23. Weight in Grams: 1380.
- Format
- Paperback
- Publication date
- 1999
- Publisher
- Springer London Ltd United Kingdom
- Edition
- Softcover reprint of the original 1st ed. 1999
- Number of pages
- 443
- Condition
- New
- SKU
- V9781852331474
- ISBN
- 9781852331474
Paperback
Condition: New
€ 190.99
€ 190.99
Reliability of Nanoscale Circuits and Systems: Methodologies and Circu...
Stanisavljevic, Milos; Schmid, Alexandre; Leb...
hardcover. Provides a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Num Pages: 195 pages, biography. BIC Classification: TGPQ; TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 18. Weight in Grams: 502.
- Format
- Hardback
- Publication date
- 2010
- Publisher
- Springer United States
- Edition
- 2011th Edition
- Number of pages
- 195
- Condition
- New
- SKU
- V9781441962164
- ISBN
- 9781441962164
Hardback
Condition: New
€ 122.67
€ 122.67
Paperback. Num Pages: 222 pages, biography. BIC Classification: TGPR; TJFC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 12. Weight in Grams: 349.
- Format
- Paperback
- Publication date
- 2014
- Publisher
- Springer-Verlag New York Inc. United States
- Number of pages
- 222
- Condition
- New
- SKU
- V9781489982544
- ISBN
- 9781489982544
Paperback
Condition: New
€ 121.88
€ 121.88
Reliability of Microtechnology: Interconnects, Devices and Systems
Liu, Johan; Salmela, Olli; Sarkka, Jussi; Mor...
paperback. This text discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. It covers many topics, and it addresses specific failure modes in solder and conductive adhesives at great length. Num Pages: 217 pages, 50 black & white tables, biography. BIC Classification: TDPB; TGPR; TJF; TJFD. Category: (G) General (US: Trade). Dimension: 235 x 155 x 12. Weight in Grams: 343.
- Format
- Paperback
- Publication date
- 2014
- Publisher
- Springer United States
- Edition
- 2011th Edition
- Number of pages
- 217
- Condition
- New
- SKU
- V9781489982117
- ISBN
- 9781489982117
Paperback
Condition: New
€ 185.77
€ 185.77
Reliability of Microtechnology: Interconnects, Devices and Systems
Liu, Johan; Salmela, Olli; Sarkka, Jussi; Mor...
hardcover. This text discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. It covers many topics, and it addresses specific failure modes in solder and conductive adhesives at great length. Num Pages: 217 pages, 50 black & white tables, biography. BIC Classification: TDPB; TGPR; TJF. Category: (P) Professional & Vocational. Dimension: 238 x 160 x 19. Weight in Grams: 490.
- Format
- Hardback
- Publication date
- 2011
- Publisher
- Springer United States
- Edition
- 2011th Edition
- Number of pages
- 217
- Condition
- New
- SKU
- V9781441957597
- ISBN
- 9781441957597
Hardback
Condition: New
€ 189.73
€ 189.73
Paperback. Num Pages: 509 pages, 105 black & white tables, biography. BIC Classification: TGPQ; TJF. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 28. Weight in Grams: 842.
- Format
- Paperback
- Publication date
- 2012
- Publisher
- Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
- Edition
- Softcover reprint of the original 1st ed. 1999
- Number of pages
- 509
- Condition
- New
- SKU
- V9783642636257
- ISBN
- 9783642636257
Paperback
Condition: New
€ 135.37
€ 135.37
Paperback. Num Pages: 469 pages, biography. BIC Classification: THR; TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 24. Weight in Grams: 657.
- Format
- Paperback
- Publication date
- 2013
- Publisher
- Springer-Verlag New York Inc. United States
- Edition
- 2nd ed. 1992. Softcover reprint of the original 2
- Number of pages
- 469
- Condition
- New
- SKU
- V9781489906878
- ISBN
- 9781489906878
Paperback
Condition: New
€ 304.28
€ 304.28
Hardback. Provides coverage of fault trees and a more complete examination of probability distribution. Num Pages: 469 pages, biography. BIC Classification: TGPR; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 157 x 31. Weight in Grams: 822.
- Format
- Hardback
- Publication date
- 1992
- Publisher
- Springer Science+Business Media United States
- Edition
- 2nd ed. 1992
- Number of pages
- 469
- Condition
- New
- SKU
- V9780306440632
- ISBN
- 9780306440632
Hardback
Condition: New
€ 310.10
€ 310.10
Hardcover. This book shows how to build in, evaluate, and demonstrate reliability and availability of components, equipment, systems. It features checklists for design reviews and more than 100 practice oriented examples. Num Pages: 650 pages, biography. BIC Classification: KJMV6; KJU; TJF. Category: (P) Professional & Vocational. Dimension: 235 x 155. .
- Publisher
- Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
- Number of pages
- 650
- Format
- Hardback
- Publication date
- 2017
- Edition
- 8th ed. 2017
- Condition
- New
- SKU
- V9783662542088
- ISBN
- 9783662542088
Hardback
Condition: New
€ 326.47
€ 326.47
Hardcover. An Integrated Approach to Product Development Reliability Engineering presents an integrated approach to the design, engineering, and management of reliability activities throughout the life cycle of a product, including concept, research and development, design, manufacturing, assembly, sales, and service. Series: Wiley Series in Systems Engineering and Management. Num Pages: 512 pages, colour illustrations, colour tables, figures, graphs. BIC Classification: THX; TJ. Category: (P) Professional & Vocational. Dimension: 261 x 178 x 30. Weight in Grams: 1210.
- Publisher
- John Wiley & Sons Inc United States
- Number of pages
- 480
- Format
- Hardback
- Publication date
- 2014
- Edition
- 1st Edition
- Condition
- New
- SKU
- V9781118140673
- ISBN
- 9781118140673
Hardback
Condition: New
€ 156.27
€ 156.27
Paperback. Here is comprehensive coverage of reliability issues and their countermeasures in large-scale digital control systems, from the hardware and software in digital systems to the human operators who supervise the overall process of large-scale systems. Editor(s): Seong, Poong Hyun. Series: Springer Series in Reliability Engineering. Num Pages: 304 pages, 36 black & white tables, biography. BIC Classification: TBC; TGPQ; THK; TJFM; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 17. Weight in Grams: 462.
- Format
- Paperback
- Publication date
- 2010
- Publisher
- Springer London Ltd United Kingdom
- Edition
- 1st ed. Softcover of orig. ed. 2009
- Number of pages
- 304
- Condition
- New
- SKU
- V9781849967976
- ISBN
- 9781849967976
Paperback
Condition: New
€ 237.40
€ 237.40
Hardback. Here is comprehensive coverage of reliability issues and their countermeasures in large-scale digital control systems, from the hardware and software in digital systems to the human operators who supervise the overall process of large-scale systems. Editor(s): Seong, Poong Hyun. Series: Springer Series in Reliability Engineering. Num Pages: 304 pages, 36 black & white tables, biography. BIC Classification: TJFM; UB. Category: (P) Professional & Vocational. Dimension: 243 x 166 x 24. Weight in Grams: 576.
- Format
- Hardback
- Publication date
- 2008
- Publisher
- Springer London Ltd United Kingdom
- Number of pages
- 304
- Condition
- New
- SKU
- V9781848003835
- ISBN
- 9781848003835
Hardback
Condition: New
€ 243.56
€ 243.56
Reliability and Availability of Quality Control Based on Wavelet Compu...
Kuzmanic, Ivica; Vujovic, Igor
Paperback. Series: SpringerBriefs in Electrical and Computer Engineering. Num Pages: 68 pages, 6 black & white illustrations, 5 colour illustrations, biography. BIC Classification: TGPR; TJF; TTBM; UYQV. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 4. Weight in Grams: 134.
- Format
- Paperback
- Publication date
- 2014
- Publisher
- Springer International Publishing AG Switzerland
- Number of pages
- 68
- Condition
- New
- SKU
- V9783319133164
- ISBN
- 9783319133164
Paperback
Condition: New
€ 69.32
€ 69.32