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CMOS Test and Evaluation: A Physical Perspective
Bhushan, Manjul; Ketchen, Mark B.
€ 150.88
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Description for CMOS Test and Evaluation: A Physical Perspective
paperback. Num Pages: 437 pages, 338 black & white illustrations, 54 black & white tables, biography. BIC Classification: TGPR; TJF; TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 23. Weight in Grams: 670.
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Product Details
Format
Paperback
Publication date
2016
Publisher
Springer United States
Number of pages
437
Condition
New
Number of Pages
424
Place of Publication
New York, United States
ISBN
9781493947027
SKU
V9781493947027
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Bhushan, Manjul; Ketchen, Mark B.
Manjul Bhushan is a technical consultant in New York. Mark Ketchen is a technical consultant in Massachusetts.
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