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Data Mining and Diagnosing IC Fails
Leendert M. (Ibm Microelectronics Division) Huisman
€ 122.33
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Description for Data Mining and Diagnosing IC Fails
Paperback. Series: Frontiers in Electronic Testing. Num Pages: 270 pages, 46 black & white illustrations, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 14. Weight in Grams: 386.
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and ... Read more
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and ... Read more
Product Details
Format
Paperback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
270
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
250
Place of Publication
New York, NY, United States
ISBN
9781441937674
SKU
V9781441937674
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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