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Defect and Fault Tolerance in VLSI Systems
. Ed(S): Stapper, C.H.; Jain, V. K.; Saucier, Gabriele
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Description for Defect and Fault Tolerance in VLSI Systems
Paperback. Editor(s): Stapper, C.H.; Jain, V. K.; Saucier, Gabriele. Num Pages: 316 pages, biography. BIC Classification: THR; TJFC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 18. Weight in Grams: 633.
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford ... Read more
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
316
Condition
New
Number of Pages
316
Place of Publication
New York, NY, United States
ISBN
9781475799590
SKU
V9781475799590
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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