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. Ed(S): Chikawa, J. K. Junichi; Sumino, K.; Wada, K. - Defects and Properties of Semiconductors - 9789401086165 - V9789401086165
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Defects and Properties of Semiconductors

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Description for Defects and Properties of Semiconductors Paperback. Editor(s): Chikawa, J. K. Junichi; Sumino, K.; Wada, K. Series: Advances in Solid State Technology (Closed). Num Pages: 272 pages, biography. BIC Classification: PHFC; TGM; TJFD5. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 14. Weight in Grams: 402.
This volume contains nearly all of the papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL TECHNOLOGY. The Symposium was organized by the promoting committee of the research project "Quality Developement of Semiconductors by Utilization of Crystal Defects" sponsored by the Science and Technology Agency of Japan. Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication. Recently, a new trend ... Read more

Product Details

Format
Paperback
Publication date
2011
Publisher
Springer Netherlands
Number of pages
272
Condition
New
Series
Advances in Solid State Technology (Closed)
Number of Pages
300
Place of Publication
Dordrecht, Netherlands
ISBN
9789401086165
SKU
V9789401086165
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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