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Design for AT-speed Test, Diagnosis and Measurement
Benoit . Ed(S): Nadeau-Dostie
€ 201.44
FREE Delivery in Ireland
Description for Design for AT-speed Test, Diagnosis and Measurement
Hardback. Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design. Editor(s): Nadeau-Dostie, Benoit. Series: Frontiers in Electronic Testing. Num Pages: 256 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 254 x 178 x 15. Weight in Grams: 670.
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, ... Read more
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, ... Read more
Product Details
Format
Hardback
Publication date
1999
Publisher
Kluwer Academic Publishers United States
Number of pages
256
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
239
Place of Publication
Dordrecht, Netherlands
ISBN
9780792386698
SKU
V9780792386698
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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